• Nanoindentation system for nano and micro - hardness testing.
• Impact Testing
• Scratch and Wear Testing with the Nano Test Scanning Module.
• High Temperature Nano Testing.
• Optional AFM Attachment.
• Multiple Ojective Microscope.

Micro Materials Ltd.

Unit 3, The Bayre,
Wrexham Technology
Park
Wrexham
ll13 7YP,United kingdom

Phone:+44-1978 261615
Fax      : +44-1978 356966
Web    :  www.micromaterials.co.uk
Market Segments
Nano Technology, Semiconductors,
Material Science

► Raith e_LiNE/Raith 150
► RAITH150 - TWO

E-Beam Writer upto 20nm feature size.
Ultra high Resolution E-Beam Lithography and Metrology tool.

• Options: SEM metrology In-situ nano manipulator for electrical measurement.
• EDX
• Gas Injection & EBID Module for In-situ metal deposition.
• Ion_Line Ion Beam Lithography
• Universal CAD Navigation System for the Semiconductor Industry.
• ELPHY Pattern generator as a retrofit to SEM to use it as e_beam writer.                 

Raith GmbH

Hauert 18, D-44227, Dortmund,
Germany
Phone : +49 231 975000-0
Fax      : +49 231 975000-5
Web    :  www.raith.com

Market Segments
Nano technology
Semiconductors, MEMS,
Photonics

FOGALE nanotech

• Non-contact surface profilers. Sub-nanometer resolution
  - Non-contact measurements by optical interferometry with vertical resolution down to 0.1 nm
• Fast result
  - Full field 3D measurements in just a few seconds.
• Versatile
  -Reflectivity 1% to 100%:Transparent films (Glass),Silicon,Metal
• Non-contact measurements
  - All measurements are non destructive,repetable and require no sample preparation.

3 models available-

•  Zoomsurf 3D
• Photomap 3D
• Microsurf 3D   

FOGALE nanotech

125 rue de l’Hostellerie
Ville Active - Acti +
Bât A 30900 Nîmes
France
Tel: +33 (0)4 66 62 05 55
Fax: +33 (0)4 66 62 71 60

Web : www.fogale.fr

Market Segments
Semiconductors,
Material Reseach,
Nanotechnology.

High Sensitivity Quantitative 3D Compositional imaging and Analysing with Atomic resolution.

Model 3 DAP-X:

• 3D Atom Probe Microscope for atomic resolution.
•  3D Composition imaging & analysis of Metallic Alloys.

Model 3000X Si:

LEAP Microscopy, known as Atom Probe for Characterization of Semiconductor Specimen with Laser and Voltage Pulsing operating modes.

                                

Imago Scientific Instruments Corporation

5500 Nobel Drive
Madison, WI 53711 USA
Phone: +1 (608) 274-6880
Toll-free: +1 (877) GO-IMAGO
Fax: +1 (608) 442-0622
Web : www.imago.com

Market segment

Semiconductor, Metallurgy, Advance materials data Storage .

Surface Analysis Systems :
compact ESCA System, LEED
XPS/UPS, ISS, SEMS/SAM,MBE, RHEED
- Hemispherical analyzers
X-Ray Sources, Electron sources,UV Sources, LEED,
X-Ray refraction Scanner, Flood Gun
- UHV STM
-Plasma Atom / lon Sources

SPECS GmbH

Voltastass 5, D-13355
Berlin, Germany
Phone : +49-304-678240
Fax      : +49-304-642083
web     :  www.specs.de

Market Segments
Surface Analysis, Nano Technology, Thin Film Growth.